Yieldhub

Yieldhub

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Enterprise Yield Management Platform for Semiconductor & Integrated Photonics | Enabling Real-Time & Smart Manufacturing.

Helping manufacturers improve yield, reduce test costs, accelerate NPI and increase engineering & manufacturing efficiency. ABOUT

yieldHUB is a global Enterprise Yield Management Platform helping semiconductor and integrated photonics manufacturers improve yield, reduce test costs, accelerate New Product Introduction (NPI), and enable Real-Time & Smart Manufacturing. Our platform transforms semiconductor test, manufacturing, quality and reliability data into trusted insights that help engineering and operations teams make faster decisions, identify root causes sooner and improve manufacturing performance. By unifying fragmented data into a single governed platform, yieldHUB increases engineering productivity, improves product quality and reliability, unlocks hidden manufacturing capacity and supports the journey from NPI through to high-volume manufacturing. Trusted by leading fabless semiconductor companies, IDMs, foundries, OSATs and integrated photonics manufacturers worldwide, yieldHUB has been helping manufacturers optimize yield and manufacturing operations for over 21 years. OUR STORY

Founded in 2005 by engineer John O'Donnell, yieldHUB was created to solve a problem every semiconductor engineer facedโ€”spending too much time preparing data instead of solving manufacturing challenges. Today, yieldHUB is a globally trusted platform with customers and employees across Europe, North America and Asia, supporting some of the world's leading semiconductor and photonics manufacturers. OUR MISSION

This page shares the latest news, insights and innovations from yieldHUB and the wider semiconductor industry. We aim to create a community where engineers, manufacturing leaders and technology professionals can learn, share knowledge and stay informed. COMMUNITY GUIDELINES

We encourage respectful, constructive discussions and reserve the right to remove content that is offensive, abusive, misleading, discriminatory, spam, or infringes intellectual property rights. Repeated violations may result in users being blocked from the page.

22/09/2026

Weโ€™re excited to exhibit at SEMICON West 2026!

Looking forward to connecting with customers, partners, and industry peers from across the microelectronics supply chain. Stop by our booth #6254; weโ€™d love to connect with you!

22/09/2026

Huge news! We're heading to SEMICON West ๐ŸŽ‰ โœˆ๏ธ

yieldHUB is exhibiting in San Francisco ๐Ÿ‡บ๐Ÿ‡ธ as part of the Irish delegation, alongside Enterprise Ireland USA, IDA Ireland and Tyndall National Institute - enterprise growth, global investment and world-class research, brought to industry together ๐Ÿค

For over 21 years we've helped semiconductor companies stop losing margin and delivery dates to problems hiding in their test data. Deep US experience with an established US customer base and tens of billions of chips analyzed annually across fabless, IDMs, foundries and OSATs. You are not the beta site!

Join us at the Irish Pavilion โ˜˜๏ธ, Wednesday morning, October 14th 2026. We're also available throughout the event ๐Ÿ‘ฉโ€๐Ÿ’ป ๐Ÿ‘จโ€๐Ÿ’ป

RSVP to meet us ๐Ÿ”— : https://lnkd.in/ejvgWuGi

We'd be delighted to arrange a coffee โ˜• and conversation in San Francisco ๐ŸŒ‰

19/09/2026

If you want to learn how to use AI like Gen Z here is your starter pack: https://www.yieldhub.com/blogs/using-ai-like-the-top-0-1

18/09/2026

Your ERP is not a yield management system.

Neither is your MES.

And JMP isn't one either.

In this article Gillian answered the questions she get asked most:
- What does a YMS actually do
- How it finds the root cause of yield loss
- What is its value to a company financially
- Does your current setup qualify.

If you work in a fabless, OSAT or IDM, start with the last one.

Link: https://www.yieldhub.com/blogs/what-is-a-yield-management-solution

17/09/2026

Supercharged NPI reports โšก

Up to 99% faster characterization. yieldHUB NPI puts all the NPI data in one place, so the knowledge your experts have stays available to production.

Characterization, Gage R&R, parametric, bin and drift analysis, all in one tool.

Instant interactive engineering data analysis, built on market leading technology. Manipulate your data in the browser, with no manual downloads:

๐Ÿ’ฌ "We were able to... show variation at different voltages and temperatures all in one plot to work out if we could improve things."

Photos from Yieldhub's post 16/09/2026

"It is really impressive how yieldHUB does genealogy correlation." ๐Ÿ’ฌ

A Senior Manager of Product Engineering at a fabless SoC company, on his favourite part of yieldHUB.

Genealogy ๐Ÿงฌ is the full record of a die's life: wafer, lot, every process step and every test result, from bare wafer to assembled part.

Most teams think they need more data. They need the data they already have, connected. His OSATs each handed back their own files. Now it all sits in one place, linked from fab to shipping.

"The genealogy correlation enables me to notice any issue as it happened."

๐Ÿ“ค If you've ever waited a week for an OSAT to resend a lot file, send this to whoever owns your test data.

๐Ÿ‘‰ Swipe for the full story. To see it on your own data, book a consultation at www.yieldhub.com.

16/09/2026

yieldHUB is exhibiting at ITC 2026 ๐Ÿ‡บ๐Ÿ‡ธ

Find us at booth #602, October 13-15, Grand Hyatt River Walk, San Antonio, Texas ๐Ÿค 

Kevin Robinson, VP of Operations, and Carl S. Moore, Yield Management Specialist, will be on the booth all three days.

Come and talk to them about our full range of semiconductor yield solutions, including the yieldHUB core platform, yieldHUB NPI and yieldHUB Live.

Bring us your toughest first-pass yield or capacity problem.

Book a slot with the team: yieldhub.com/contact

14/09/2026

It may be pouring rain here in Limerick, but letโ€™s bring some clarity to semiconductor manufacturing data ๐ŸŒง๏ธ

When yield drops, how quickly can you trace the problem back to its true source?

Genealogy correlation is the correlation of yield, bins and parameters from one manufacturing stage to another. If a sensitivity is detected, such knowledge can lead to better control of the parameter in the foundry, thus leading to increased yield and quality.

In yieldHUB, that data is linked automatically, 24/7. Reports are ready the moment you open it.

Curious how it is implemented?
https://www.yieldhub.com/blogs/genealogy-correlation

07/09/2026

Our VP of Operations Kevin Robinson is having a blast at the inaugural UK Silicon Carbide Network Conference at the University of Warwick ๐Ÿ‡ฌ๐Ÿ‡ง

We're here talking SiC yield management: how fast engineers can turn test data into decisions as production scales.

Every wafer off a JBS/MPS diode or MOSFET line has to function properly and meet the customer's requirements, and the proof of that lives in the data โšก

Here's how one SiC customer describes it ๐Ÿ’ฌ :

"We need quick and graphical representation of the results in a format that is understandable as engineers, so we're able to convey that to customers. That's what yieldHUB does."

"It saves us time in data storage, and manipulation and I'd say we can do this in under half the time because of yieldHUB."

Missed Kevin today? Come to the booth tomorrow ๐Ÿ‘‹

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